# 508, HBI Center, Hanyang University, Sa-3-dong
Nano-View is developing and producing the state of art equipments that can measure analyze thickness, optical properties, composition ratio surface roughness semiconductor, conductor, dielectric liquid thin films are used in semiconductor devices, LCD ...
Spectroscopic Elipsometry Mg-1000, Spectroscopic Elipsometry Mf-1000, Rubbins-1000, PV-ARC, PV-1000, Imaging Ellipsometry-1000, Mapping Spectroscopic Elipsometry-1000, sollar, spectroscopic, ellipsometer